Trait BatchableCircuit

pub trait BatchableCircuit<F> {
    // Required method
    fn aggregate_verify_keys<E, P>(
        &mut self,
        vk_type_a_vars: &[VerifyingKeyVar<E>],
        vk_type_b_vars: &[VerifyingKeyVar<E>],
    ) -> Result<Vec<VerifyingKeyVar<E>>, CircuitError>
       where E: Pairing,
             P: TEParam<BaseField = F>;
}

Plonk Circuit that support batch verification

Required Methods

fn aggregate_verify_keys<E, P>( &mut self, vk_type_a_vars: &[VerifyingKeyVar<E>], vk_type_b_vars: &[VerifyingKeyVar<E>], ) -> Result<Vec<VerifyingKeyVar<E>>, CircuitError>

where E: Pairing, P: TEParam<BaseField = F>,

Aggregate verification keys

Dyn Compatibility

This trait is not dyn compatible.

In older versions of Rust, dyn compatibility was called "object safety", so this trait is not object safe.

Implementations on Foreign Types

impl<F> BatchableCircuit<F> for PlonkCircuit<F>

where F: PrimeField,

Instances batching scheme related gates

fn aggregate_verify_keys<E, P>( &mut self, vk_type_a_vars: &[VerifyingKeyVar<E>], vk_type_b_vars: &[VerifyingKeyVar<E>], ) -> Result<Vec<VerifyingKeyVar<E>>, CircuitError>

where E: Pairing, P: TEParam<BaseField = F>,

Implementors