Trait BatchableCircuit 

pub trait BatchableCircuit<F> {
    // Required method
    fn aggregate_verify_keys<E, P>(
        &mut self,
        vk_type_a_vars: &[VerifyingKeyVar<E>],
        vk_type_b_vars: &[VerifyingKeyVar<E>],
    ) -> Result<Vec<VerifyingKeyVar<E>>, CircuitError>
       where E: Pairing,
             P: TEParam<BaseField = F>;
}

Plonk Circuit that support batch verification

Required Methods

fn aggregate_verify_keys<E, P>( &mut self, vk_type_a_vars: &[VerifyingKeyVar<E>], vk_type_b_vars: &[VerifyingKeyVar<E>], ) -> Result<Vec<VerifyingKeyVar<E>>, CircuitError>

where E: Pairing, P: TEParam<BaseField = F>,

Aggregate verification keys

Dyn Compatibility

This trait is not dyn compatible.

In older versions of Rust, dyn compatibility was called "object safety".

Implementations on Foreign Types

impl<F> BatchableCircuit<F> for PlonkCircuit<F>

where F: PrimeField,

Instances batching scheme related gates

fn aggregate_verify_keys<E, P>( &mut self, vk_type_a_vars: &[VerifyingKeyVar<E>], vk_type_b_vars: &[VerifyingKeyVar<E>], ) -> Result<Vec<VerifyingKeyVar<E>>, CircuitError>

where E: Pairing, P: TEParam<BaseField = F>,

Implementors